Person in charge :
Arie VAN DER LEE
Phone: +33 4 67 14 91 35
E-mail : arie.van-der-lee@umontpellier.fr
Services :
-X-ray reflectometry :
- analysis of density/thickness/roughness of thin films
-X-ray diffraction on powders/single crystals/thin films
- Crystalline phase identification
- Atomic structure determination of a crystalline phase
- Measurements under pression/stress/high and low temperatures/ultra-violet irradiation
Equipments
Gemini-S (Agilent Technologie)
Single-crystal diffractometer
Bruker D5000 Powder and thin film diffractometer/ Reflectometry at ambient conditions or under controlled atmosphere.
X’pert Pro (Pan Analytical) Powder diffractometer for phase identification and quantitative Rietveld analysis.
